DocumentCode
3554767
Title
A fully implanted V-groove power MOSFET
Author
Fuoss, Dennis ; Verma, Krishna
Author_Institution
Tektronix Inc., Beaverton, Oregon
Volume
24
fYear
1978
fDate
1978
Firstpage
657
Lastpage
660
Abstract
This paper presents a microwave V-Groove Silicon Power MOSFET (VMOS) with drain to source breakdown voltage of 100V and drain current capability of 0.5A, and a forward transconductance of 150 millimho. A gain-bandwidth product (fT ) of 1.5 GHz has been measured. The power density of this enhancement device is about 20KW/cm2of the active area. A refractory metal scheme has been used for improved device reliability. Ion implantation has been utilized in processing the device in order to obtain process control and good threshold voltage uniformity. A theoretical model of the device has been developed, and experimental data are compared with simple theory.
Keywords
Breakdown voltage; Doping; MOSFET circuits; Microwave FETs; Microwave devices; Parasitic capacitance; Power MOSFET; Substrates; Thermal resistance; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189504
Filename
1479929
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