• DocumentCode
    3554767
  • Title

    A fully implanted V-groove power MOSFET

  • Author

    Fuoss, Dennis ; Verma, Krishna

  • Author_Institution
    Tektronix Inc., Beaverton, Oregon
  • Volume
    24
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    657
  • Lastpage
    660
  • Abstract
    This paper presents a microwave V-Groove Silicon Power MOSFET (VMOS) with drain to source breakdown voltage of 100V and drain current capability of 0.5A, and a forward transconductance of 150 millimho. A gain-bandwidth product (fT) of 1.5 GHz has been measured. The power density of this enhancement device is about 20KW/cm2of the active area. A refractory metal scheme has been used for improved device reliability. Ion implantation has been utilized in processing the device in order to obtain process control and good threshold voltage uniformity. A theoretical model of the device has been developed, and experimental data are compared with simple theory.
  • Keywords
    Breakdown voltage; Doping; MOSFET circuits; Microwave FETs; Microwave devices; Parasitic capacitance; Power MOSFET; Substrates; Thermal resistance; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1978 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1978.189504
  • Filename
    1479929