DocumentCode :
3554855
Title :
The preparation of low current-threshold infra-red-visible (0.89-0.72 µm) AlxGa1-xAs/AlyGa1-yAs double-heterostructure lasers by molecular beam epitaxy
Author :
Tsang, W.T.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
fYear :
1979
fDate :
3-5 Dec. 1979
Firstpage :
104
Lastpage :
107
Abstract :
Room-temperature low current-threshold broad-area Fabry-Perot AlxGa1-xAs/AlyGa1-yAs double-heterostructure (DH) lasers have been prepared by molecular beam epitaxy (MBE) covering the lasing emission wavelength from 8900 Å to 7200 Å (infra-red-visible). In this emission range, the averaged pulsed current threshold densities, Jth, are as low as those obtained by liquid-phase epitaxy (LPE). At ∼ 8200 Å, the wavelength at which DH lasers have also been prepared by metalorganic chemical-vapor deposition (MO-CVD), the Jth´s of the MBE grown lasers are lower. For the best wafers grown, the averaged Jth´s are 800 A/cm2, 1.0 kA/cm2and 2.8 kA/cm2(375µm × 200µm × 0.1-0.15µm) at ∼ 8800 Å, ∼ 8300 Å and ∼ 7200 Å, respectively. The importance of various growth conditions such as substrate-temperature and others for growing such low current-threshold DH lasers are studied. It is found that the Jthdecreases with increasing substrate-temperature from ∼ 450°C to ∼ 620°C. Laser wafers with lowest Jth´s are grown at substrate temperatures above ∼ 620°C. Regular proton-bombarded stripe-geometry lasers fabricated from GaAs-Al0.3Ga0.7As MBE DH wafers have CW threshold currents and total series resistances at least as low as those similar-geometry lasers grown by LPE. Averaged yields for such laser diodes of ≥ 90% were obtained in some wafers. Randomly picked diodes fabricated from an early MBE DH wafer having 0.4 µm GaAs active layer have operated continuously at a constant output power of ∼ 2 mW/mirror in a ∼ 38°C dry-nitrogen ambient for more than 7,000 h and still operating.
Keywords :
Chemical lasers; DH-HEMTs; Diode lasers; Epitaxial growth; Fabry-Perot; Molecular beam epitaxial growth; Pulsed laser deposition; Substrates; Temperature; Threshold current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1979 Internationa
Conference_Location :
Washington, DC, USA
Type :
conf
DOI :
10.1109/IEDM.1979.189551
Filename :
1480416
Link To Document :
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