DocumentCode
3554886
Title
Transient response of I2L
Author
Chang, Huang ; Mucai, Zheng ; Hueyyu, Tong ; Wenzberg, Shen ; Chunle, Yi ; Changyun, Chen
Author_Institution
Shaanxi Microelectronics Research Institute, Lingtong, Shaanxi, People´´s Republic of China
Volume
25
fYear
1979
fDate
1979
Firstpage
205
Lastpage
207
Abstract
Based on a device physics model given recently, we present in this paper, the analysis for transient response of I2L family with emphasis on two major factors: (1) The operation of I2L is due to the mutual interaction of three PN junctions. (2) For switching applications, the input current and voltage of the second stage are identical to the output current and voltage of the first stage. Therefore for I2L, the driving and matching conditions need particular consideration. Theoretical and experimental results will be given to illustrate essential points obtained by using the new model. The effect of these results on scaling and circuit design for I2L VLSI will be discussed.
Keywords
Transient response;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1979 Internationa
Type
conf
DOI
10.1109/IEDM.1979.189579
Filename
1480444
Link To Document