DocumentCode
3554899
Title
2500V, 600A gate turn-off thyristor (GTO)
Author
Azuma, Makoto ; Takigami, Katsuhiko ; Kurata, Mamoru
Author_Institution
Toshiba Research and Development Center, Kawasaki, Kanagawa, Japan
Volume
25
fYear
1979
fDate
1979
Firstpage
246
Lastpage
249
Abstract
The vital point for 2500V, 600A GTO design is to establish a principle for increasing maximum gate turn-off current (IATO ), while keeping overall thyristor characteristics in reasonable balance. High IATO was attained by decreasing p-base surface resistance to below a certain limit, as well as decreasing n-emitter finger width. Excellent thyristor characteristics were obtained by adopting thick p-base layer with as low as possible acceptor concentration. From a device process point of view, introducing a new annealing process of phosphorus redeposition increased carrier lifetime in the p-base to a sufficiently high level. This process contributed most strikingly to improving the off-state voltage.
Keywords
Annealing; Doping profiles; Fingers; Proximity effect; Research and development; Surface resistance; Surges; Testing; Thyristors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1979 Internationa
Type
conf
DOI
10.1109/IEDM.1979.189591
Filename
1480456
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