• DocumentCode
    3554899
  • Title

    2500V, 600A gate turn-off thyristor (GTO)

  • Author

    Azuma, Makoto ; Takigami, Katsuhiko ; Kurata, Mamoru

  • Author_Institution
    Toshiba Research and Development Center, Kawasaki, Kanagawa, Japan
  • Volume
    25
  • fYear
    1979
  • fDate
    1979
  • Firstpage
    246
  • Lastpage
    249
  • Abstract
    The vital point for 2500V, 600A GTO design is to establish a principle for increasing maximum gate turn-off current (IATO), while keeping overall thyristor characteristics in reasonable balance. High IATOwas attained by decreasing p-base surface resistance to below a certain limit, as well as decreasing n-emitter finger width. Excellent thyristor characteristics were obtained by adopting thick p-base layer with as low as possible acceptor concentration. From a device process point of view, introducing a new annealing process of phosphorus redeposition increased carrier lifetime in the p-base to a sufficiently high level. This process contributed most strikingly to improving the off-state voltage.
  • Keywords
    Annealing; Doping profiles; Fingers; Proximity effect; Research and development; Surface resistance; Surges; Testing; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1979 Internationa
  • Type

    conf

  • DOI
    10.1109/IEDM.1979.189591
  • Filename
    1480456