DocumentCode :
3554953
Title :
Measurement of microwave characteristics of helix traveling wave circuits
Author :
Legarra, James R.
Author_Institution :
Varian Associates, Inc., Palo Alto, CA
Volume :
25
fYear :
1979
fDate :
1979
Firstpage :
408
Lastpage :
411
Abstract :
A measurement technique has been developed for accurately and rapidly measuring phase velocity, loss profile, and Pierce impedance in helix traveling wave circuits. This technique employs an Automatic Network Analyzer to control a perturbation measurement sequence which generates amplitude and phase information on the microwave signals in the circuits. These data are statistically reduced in the computer and hard copy of the results is produced automatically in the form of graphs and tables. Phase velocity measurements are repeatable to within ± 0.05% and Pierce impedance to within ± 5%. Loss profiles are typically tracked down to the -20 dB level. Dispersion characteristics are measured over wide frequency ranges including the stopband regions of lossless circuits. Resonant loss profiles have been successfully measured. All these measurements can be made on production helix circuits which typically are one-port devices.
Keywords :
Automatic generation control; Impedance measurement; Information analysis; Loss measurement; Measurement techniques; Microwave circuits; Microwave measurements; Phase measurement; Signal analysis; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1979 Internationa
Type :
conf
DOI :
10.1109/IEDM.1979.189639
Filename :
1480504
Link To Document :
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