DocumentCode
3554953
Title
Measurement of microwave characteristics of helix traveling wave circuits
Author
Legarra, James R.
Author_Institution
Varian Associates, Inc., Palo Alto, CA
Volume
25
fYear
1979
fDate
1979
Firstpage
408
Lastpage
411
Abstract
A measurement technique has been developed for accurately and rapidly measuring phase velocity, loss profile, and Pierce impedance in helix traveling wave circuits. This technique employs an Automatic Network Analyzer to control a perturbation measurement sequence which generates amplitude and phase information on the microwave signals in the circuits. These data are statistically reduced in the computer and hard copy of the results is produced automatically in the form of graphs and tables. Phase velocity measurements are repeatable to within ± 0.05% and Pierce impedance to within ± 5%. Loss profiles are typically tracked down to the -20 dB level. Dispersion characteristics are measured over wide frequency ranges including the stopband regions of lossless circuits. Resonant loss profiles have been successfully measured. All these measurements can be made on production helix circuits which typically are one-port devices.
Keywords
Automatic generation control; Impedance measurement; Information analysis; Loss measurement; Measurement techniques; Microwave circuits; Microwave measurements; Phase measurement; Signal analysis; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1979 Internationa
Type
conf
DOI
10.1109/IEDM.1979.189639
Filename
1480504
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