• DocumentCode
    3554953
  • Title

    Measurement of microwave characteristics of helix traveling wave circuits

  • Author

    Legarra, James R.

  • Author_Institution
    Varian Associates, Inc., Palo Alto, CA
  • Volume
    25
  • fYear
    1979
  • fDate
    1979
  • Firstpage
    408
  • Lastpage
    411
  • Abstract
    A measurement technique has been developed for accurately and rapidly measuring phase velocity, loss profile, and Pierce impedance in helix traveling wave circuits. This technique employs an Automatic Network Analyzer to control a perturbation measurement sequence which generates amplitude and phase information on the microwave signals in the circuits. These data are statistically reduced in the computer and hard copy of the results is produced automatically in the form of graphs and tables. Phase velocity measurements are repeatable to within ± 0.05% and Pierce impedance to within ± 5%. Loss profiles are typically tracked down to the -20 dB level. Dispersion characteristics are measured over wide frequency ranges including the stopband regions of lossless circuits. Resonant loss profiles have been successfully measured. All these measurements can be made on production helix circuits which typically are one-port devices.
  • Keywords
    Automatic generation control; Impedance measurement; Information analysis; Loss measurement; Measurement techniques; Microwave circuits; Microwave measurements; Phase measurement; Signal analysis; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1979 Internationa
  • Type

    conf

  • DOI
    10.1109/IEDM.1979.189639
  • Filename
    1480504