DocumentCode
3554984
Title
Optimization, performance and limitations of monolithic polycrystalline silicon distributed RC devices
Author
Gerzberg, Levy ; Meindl, James D.
Author_Institution
Stanford University, Stanford, California
Volume
25
fYear
1979
fDate
1979
Firstpage
502
Lastpage
505
Abstract
New monolithic distributed resistor-capacitor structures (DRCs) for the realization of unique high-performance integrated filters have been characterized, optimized, and realized. These devices are implemented in polycrystalline silicon utilizing its unique properties such as high resistivity and linearity, controllable temperature sensitivity, associated distributed capacitance, and complete compatibility with both BJT and MOST fabrication processes. Parameters affecting thee properties have been studied, characterized, and used for the optimization and limitation analysis of the distributed devices. Highly-reproducible monolithic constant phase-shift filters have been fabricated simultaneously with bipolar devices resulting a frequency response accurate to within 0.04 dB over a range of 100 Hz to 40 kHz. A lumped realization of such filters would require at least 20 components with a matching better than 0.5% and more than five times increase in chip area.
Keywords
Capacitance; Conductivity; Dielectric substrates; Fabrication; Laboratories; Linearity; Matched filters; Resistors; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1979 Internationa
Type
conf
DOI
10.1109/IEDM.1979.189668
Filename
1480533
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