Title :
The characteristics of alpha particle effects on 64K CCD´s
Author :
Anolick, Eugene S. ; Camenga, Robert R. ; Chen, Li
Author_Institution :
International Business Machines Corporation, Poughkeepsie, New York
Abstract :
The sensitivity of commercially available 64K CCD devices to α particles has undergone a systematic study. The circuit and methods employed for the study are described. The variations of sensitivity with α flux, α energy, circuit frequency, circuit voltage, and data pattern is presented. Data is also discussed relating to the variation from device to device.
Keywords :
Alpha particles; Charge coupled devices; Circuits; Electrons; Error correction; Error correction codes; Frequency; Logic devices; Packaging; Voltage;
Conference_Titel :
Electron Devices Meeting, 1979 Internationa
DOI :
10.1109/IEDM.1979.189702
