• DocumentCode
    3555163
  • Title

    Session 9 Device technology — Process modeling and characterization

  • Author

    Barnes, J.J.

  • Author_Institution
    Fairchild, Palo Alto, CA, USA
  • fYear
    1980
  • fDate
    8-10 Dec. 1980
  • Firstpage
    213
  • Lastpage
    213
  • Abstract
    Start of the above-titled section of the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1980 International
  • Conference_Location
    Washington, DC, USA
  • Type

    conf

  • DOI
    10.1109/IEDM.1980.189796
  • Filename
    1481239
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3555163