Title :
Electrical-optical characteristics of buried waveguide heterostructure InGaAsP injection lasers
Author :
Wilson, R.B. ; Nelson, R.J. ; Wright, P.D.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
Abstract :
The fabrication procedure, electrical properties, and optical characteristics of InGaAsP buried-waveguide-heterostructure (BWH) lasers emitting at γ = 1.3 µm are described and compared with InGaAsP buried heterostructure (BH) and strip-buried heterostructure (SBH) lasers. Threshold currents as low as 140 mA have been achieved for the BWH structure which incorporates a high band gap quaternary waveguide layer adjacent to the active layer stripe. Measurements of the variation of the near-field and far-field patterns with stripe width indicate that the BWH device will operate in the fundamental transverse mode for stripe widths up to 5 µm.
Keywords :
Etching; Indium phosphide; Laser modes; Leakage current; Optical device fabrication; Optical waveguides; Stimulated emission; Surface emitting lasers; Threshold current; Waveguide lasers;
Conference_Titel :
Electron Devices Meeting, 1980 International
DOI :
10.1109/IEDM.1980.189840