DocumentCode :
3555212
Title :
Electrical-optical characteristics of buried waveguide heterostructure InGaAsP injection lasers
Author :
Wilson, R.B. ; Nelson, R.J. ; Wright, P.D.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
Volume :
26
fYear :
1980
fDate :
1980
Firstpage :
370
Lastpage :
373
Abstract :
The fabrication procedure, electrical properties, and optical characteristics of InGaAsP buried-waveguide-heterostructure (BWH) lasers emitting at γ = 1.3 µm are described and compared with InGaAsP buried heterostructure (BH) and strip-buried heterostructure (SBH) lasers. Threshold currents as low as 140 mA have been achieved for the BWH structure which incorporates a high band gap quaternary waveguide layer adjacent to the active layer stripe. Measurements of the variation of the near-field and far-field patterns with stripe width indicate that the BWH device will operate in the fundamental transverse mode for stripe widths up to 5 µm.
Keywords :
Etching; Indium phosphide; Laser modes; Leakage current; Optical device fabrication; Optical waveguides; Stimulated emission; Surface emitting lasers; Threshold current; Waveguide lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1980 International
Type :
conf
DOI :
10.1109/IEDM.1980.189840
Filename :
1481283
Link To Document :
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