Title :
GaAs planar doped barriers by molecular beam epitaxy
Author :
Malik, R.J. ; Board, K. ; Eastman, L.F. ; Wood, C.E.C. ; Aucoin, T.R. ; Ross, R.L. ; Savage, R.O.
Author_Institution :
U.S. Army Electronics Technology & Devices Laboratory, Fort Monmouth, NJ, USA
Abstract :
A new majority carrier rectifying barrier device designated as a "planar-doped barrier" (PDB) has been fabricated in GaAs by MBE. The key feature of the PDB structure is that the barrier height and degree of asymmetry in the I-V characteristics can be continuously and independently controlled. In addition, the barrier can be designed to yield a constant capacitance. Experimental I-V characteristics agree well with a thermionic emission model. This planar-doped-barrier concept offers significant advantages over Schottky barriers and may, in fact, evolve into a new generic class of barrier devices.
Keywords :
Capacitance; Gallium arsenide; Laboratories; Molecular beam epitaxial growth; Region 1; Schottky barriers; Schottky diodes; Semiconductor diodes; Space charge; Thermionic emission;
Conference_Titel :
Electron Devices Meeting, 1980 International
DOI :
10.1109/IEDM.1980.189865