DocumentCode :
3555261
Title :
InP/InGaAs heterojunction bipolar phototransistors with improved sensitivity
Author :
Campbell, J.C. ; Dentai, A.G. ; Burrus, C.A. ; Ferguson, J.F.
Author_Institution :
Bell Laboratories, Holmdel, New Jersey
Volume :
26
fYear :
1980
fDate :
1980
Firstpage :
526
Lastpage :
529
Abstract :
The fabrication and device characteristics of back-illuminated InP/InGaAs n-p-n heterojunction phototransistors will be described. These devices consist of a "wide-bandgap" InP emitter with smaller bandgap InGaAs base and collector layers. Uniform spectral response is observed in the wavelength range from 0.95 µm to 1.6 µm. The DC optical gain increases from approximately 40 at an input power of 1 nW to over 1000 for an input power level of 5 µW. The small-signal gain is characteristically 2 to 3 times higher than the EC gain. The cut-off frequency fTis an increasing function of the incident light level; for 1 µW of incident power fT≃ 300 MHz. The possible applications of these phototransistors in fiber optic systems will be discussed.
Keywords :
Cutoff frequency; Heterojunctions; Indium gallium arsenide; Indium phosphide; Optical device fabrication; Optical fibers; Optical sensors; Photonic band gap; Phototransistors; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1980 International
Type :
conf
DOI :
10.1109/IEDM.1980.189884
Filename :
1481327
Link To Document :
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