• DocumentCode
    3555288
  • Title

    Ballistic transport in semiconductor devices

  • Author

    Frey, Jeffrey

  • Author_Institution
    Signetics Corporation, Sunnyvale, California
  • Volume
    26
  • fYear
    1980
  • fDate
    1980
  • Firstpage
    613
  • Lastpage
    617
  • Abstract
    "Ballistic" transport of electrons or holes, which can occur in Si and GaAs devices on distance scales of the order of tenths of microns, is transport unimpeded by interactions with the crystal lattice itself, with lattice defects, with impurities, or with interfaces - i.e., transport akin to that of a bullet in free space. Without the "drag" exerted by such interactions, charge carriers can achieve velocities several times those in larger devices, with a consequent multiplication of device speed. While it is difficult to achive pure ballistic transport, speeds can, nevertheless, increase somewhat as device sizes approach carrie mean free paths. This paper will discuss the nature of electron transport in devices so tiny that the familiar relationships between velocity and field with which materials have usually been described, no longer apply.
  • Keywords
    Ballistic transport; Gallium arsenide; Impurities; Lattices; MESFETs; Optical saturation; Optical scattering; Phonons; Semiconductor devices; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1980 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1980.189908
  • Filename
    1481351