DocumentCode :
3555301
Title :
Effects of gate structure on static induction thyristor
Author :
Nishizawa, Jun-ichi ; Ohtsubo, Yoshinobu
Author_Institution :
Tohoku University, Sendai, Japan
Volume :
26
fYear :
1980
fDate :
1980
Firstpage :
658
Lastpage :
661
Abstract :
Basic characteristics of static induction thyristor have been discussed experimentally by fabricating buried diffused gate structure devices having various gate to gate spacing. The decrease of the gate to gate spacing increases a forward voltage blocking gain. Here the forward voltage blocking gain is varied from 10 to 700. The gate turn-off current increases continuously with increasing the forward voltage blocking gain, while the forward voltage drop is kept almost constant for the variation of the forward voltage blocking gain from 10 to 700. Switching speed is optimized at a certain forward voltage blocking gain such as 300 to 500.
Keywords :
Anodes; Breakdown voltage; Cathodes; Charge carrier processes; Current density; Impurities; Low voltage; Semiconductor diodes; Thyristors; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1980 International
Type :
conf
DOI :
10.1109/IEDM.1980.189920
Filename :
1481363
Link To Document :
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