DocumentCode
3555318
Title
Thin film AC ZnSx Se1-x :Mn EL
Author
Miura, Shoshin ; Sato, Sei
Author_Institution
Fujitsu Laboratories Ltd., Kobe, Japan
Volume
26
fYear
1980
fDate
1980
Firstpage
715
Lastpage
718
Abstract
Conventional ZnS:Mn electroluminescence (EL) device has a good level of brightness but needs a high operating voltage. The best way to lower the operating voltage seemed to be by reducing the band gap of the host material and to achieve this, ZnSe had been proposed before. However, our experiments showed that when the ZnSe:Mn EL was operated at low voltages the brightness level and contrast ratio decreased, due to the yellowish coloration of the ZnSe film. The authors have developed a host material which combines both advantages; the high brightness level of ZnS, and the low operating voltage of ZnSe. A material with a band gap between those of ZnS (3.7 eV) and ZnSe (2.7 eV) was tested. By coevaporation of ZnS and ZnSe, a solid solution ZnSx Se1-x was found in an evaporated film. By measuring the absorption edge and using X-ray techniques, we found that the band gap varied in proportion to the concentration of selenium. A thin film of ZnS0.4 Se0.6 EL sandwiched between Y2 O3 insulating layers can operate at a low voltage (120 V) with a high level of brightness (>100 fL at 1 KHz), with a very small upward voltage shift (10 V) during aging.
Keywords
Brightness; Electroluminescent devices; Electromagnetic wave absorption; Insulation; Low voltage; Materials testing; Photonic band gap; Solids; Transistors; Zinc compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1980 International
Type
conf
DOI
10.1109/IEDM.1980.189936
Filename
1481379
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