DocumentCode :
3555329
Title :
Twin-tub CMOS - A technology for VLSI circuits
Author :
Parrillo, L.C. ; Payne, R.S. ; Davis, R.E. ; Reutlinger, G.W. ; Field, R.L.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
Volume :
26
fYear :
1980
fDate :
1980
Firstpage :
752
Lastpage :
755
Abstract :
CMOS technology has been developed through several generations of design rules with an n-type substrate (where p-channel transistors were formed) and with a p-tub implanted and diffused region (where n-channel transistors were formed). In order to enable a separate optimization of both transistors and to utilize the dopant control available with implanted layers, a two-tub approach was adopted. Utilizing lightly doped epi on an n+substrate (for latch-up protection), nitride-masked self-aligned tubs, 1016cm-3surface doping and 600Å gate oxides, an 8-mask CMOS process (named \´Twin-Tub") was formulated. The combination of n on n+epi and careful I/O layout renders the circuits latch-up free. Novel aspects of the process, the devices it produces and finally the resultant circuit performance are herein described.
Keywords :
Aluminum; Boron; CMOS technology; Circuit optimization; Etching; Glass; Plasma applications; Plasma devices; Plasma properties; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1980 International
Type :
conf
DOI :
10.1109/IEDM.1980.189946
Filename :
1481389
Link To Document :
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