• DocumentCode
    3555343
  • Title

    The junction MOS (JMOS) transistor - A high speed transistor for VLSI

  • Author

    Sun, E. ; Hoefflinger, B. ; Moll, J. ; Sodini, C. ; Zimmer, G.

  • Author_Institution
    Hewlett-Packard Laboratories, Palo Alto, CA
  • Volume
    26
  • fYear
    1980
  • fDate
    1980
  • Firstpage
    791
  • Lastpage
    794
  • Abstract
    A new type of MOS device (JMOS) has been fabricated with both bulk and SOS technology, using a layered n-p p-junction structure underneath the MOS gate region. This structure reduces the surface field while maintaining surface conduction. The effective mobility of these junction MOS devices exceeds that of conventional MOS devices by 20-40 percent in bulk and by 50-70 percent in SOS. The saturation current of JMOS compared to conventional MOS also increases from 50 to more than 100 percent. However, the improvement in current drive capability decreases as effective gate bias increases or as the channel length decreases due to the high field effect.
  • Keywords
    Capacitance; Doping; Laboratories; MOS devices; MOSFETs; Scattering; Sun; Transconductance; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1980 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1980.189957
  • Filename
    1481400