Title :
A sub-nanosecond ISL technology demonstrated in a 400 mil × 400 mil VLSI chip
Author :
Lamb, D.R. ; Roberts, P.C.T. ; Belt, R. ; Bostick, D. ; Stevens, H. ; Pai, S. ; Burbank, D.
Author_Institution :
Honeywell, Systems and Research Center, Minneapolis, Minnesota
Keywords :
Belts; Fabrication; Logic devices; Logic gates; Road transportation; Schottky diodes; Semiconductor device measurement; Solid state circuits; Temperature; Very large scale integration;
Conference_Titel :
Electron Devices Meeting, 1980 International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/IEDM.1980.189971
