• DocumentCode
    3555404
  • Title

    Effects of environmental testing on the surface transfer impedance/EMP response of cable assemblies with metal banded braid terminations

  • Author

    Hoeft, Lothar O. ; Hofstra, Joseph S. ; Dibble, Gary L.

  • Author_Institution
    BDM Int. Inc., Albuquerque, NM, USA
  • fYear
    1991
  • fDate
    12-16 Aug 1991
  • Firstpage
    46
  • Lastpage
    49
  • Abstract
    The surface transfer impedance and electromagnetic pulse (EMP) response of two sets of samples were measured before and after a series of environmental tests. Each sample consisted of 1 m of multiconductor cable terminated to a backshell which in turn was mounted on a MIL-C-81511 connector. The surface transfer impedance and the EMP response were measured using the procedures of MIL-C-24640 and MIL-C-85485A, modified to accommodate cable assemblies rather than samples of cables. Samples that used a metal band method of braid termination and samples that used a Metcal solder strap braid termination were evaluated and compared. The effects that mechanical and thermal environmental testing had on the integrity of the electromagnetic shielding are described. This testing was meant to simulate the adverse treatment that an interconnect system might receive during its lifetime. The results of the measurements are presented
  • Keywords
    cable sheathing; cable testing; electromagnetic compatibility; electromagnetic pulse; environmental testing; shielding; EMC; EMP response; MIL-C-24640; MIL-C-81511 connector; MIL-C-85485A; Metcal solder strap braid termination; cable assemblies; electromagnetic pulse; electromagnetic shielding; mechanical environmental testing; metal banded braid terminations; multiconductor cable; surface transfer impedance; thermal environmental testing; Assembly; Cable shielding; Cables; Connectors; EMP radiation effects; Electromagnetic measurements; Impedance measurement; Pulse measurements; Surface impedance; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
  • Conference_Location
    Cherry Hill, NJ
  • Print_ISBN
    0-7803-0158-7
  • Type

    conf

  • DOI
    10.1109/ISEMC.1991.148181
  • Filename
    148181