DocumentCode
3555425
Title
Session 2 Integrated circuits — MOS Memory
Author
Baertsch, R.D. ; Fu, H.S.
Author_Institution
General Electric Corporation, Schenectady, NY, USA
fYear
1981
fDate
7-9 Dec. 1981
Firstpage
19
Lastpage
19
Abstract
Start of the above-titled section of the conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1981 International
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/IEDM.1981.189987
Filename
1481940
Link To Document