Title :
Degradation of EM shielding effectiveness due to resonance in the low frequency region
Author :
Seki, Yasuo ; Nitta, Shuichi
Author_Institution :
Fac. of Technol., Tokyo Univ. of Agric. & Technol., Japan
Abstract :
The degradation mechanism of shielding effectiveness in the low frequency range, which cannot be understood from the waveguide model, is clarified. The extreme points in the quasi-near field are shown on an intrinsic impedance characteristics curve and the resonance phenomena on extreme points, and it is proven experimentally and statistically that the remarkable degradation of shielding effectiveness at these resonance points occurs in the shielded enclosures
Keywords :
electric field measurement; electric impedance measurement; magnetic field measurement; magnetic shielding; resonance; EM shielding effectiveness; degradation mechanism; impedance characteristics; low frequency region; quasi-near field; resonance; shielded enclosures; Antenna measurements; Degradation; Electromagnetic measurements; Electromagnetic shielding; Electromagnetic waveguides; Impedance; Magnetic field measurement; Resonance; Resonant frequency; Waveguide theory;
Conference_Titel :
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0158-7
DOI :
10.1109/ISEMC.1991.148195
