DocumentCode
3555469
Title
Sub-100 ps bulk-recombination-limited InP:Fe photoconductive detector
Author
Hammond, R.B. ; Paulter, N.G. ; Iverson, A.E. ; Smith, R.C.
Author_Institution
Los Alamos National Laboratory, Los Alamos, New Mexico
Volume
27
fYear
1981
fDate
1981
Firstpage
157
Lastpage
160
Abstract
We have studied both surface and bulk excited semi-insulating InP optoelectronic switches. We have found that transient recombination in these devices is the same for both types of excitation. We conclude that the recombination is a bulk controlled process.
Keywords
Conductivity; Electron mobility; Geometry; Indium phosphide; Microstrip; Oscilloscopes; Photoconductivity; Pulse measurements; Radiation detectors; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1981 International
Type
conf
DOI
10.1109/IEDM.1981.190027
Filename
1481980
Link To Document