• DocumentCode
    3555502
  • Title

    Experimental pretest survey-a new technique for determining EMP/lightning test points

  • Author

    Hoeft, L.O. ; Hofstra, J.S. ; Karaskiewicz, R.J. ; Cordova, W.H. ; Prather, William D.

  • Author_Institution
    BDM Int. Inc., Albuquerque, NM, USA
  • fYear
    1991
  • fDate
    12-16 Aug 1991
  • Firstpage
    142
  • Lastpage
    144
  • Abstract
    Experimental pretest survey uses a short, simple, preliminary measurement program to find and characterize the significant points of entry and coupling paths through the shielding topology surfaces to obtain an initial estimate of the upset threshold distribution. Shielding topology is characterized at one or a few frequencies using continuous wave (CW) excitation and simple measurement apparatus. The random repetitive square-wave pulse generator (R2SPG) technique is used to obtain an initial upset threshold distribution. It is shown how several techniques, such as single point excitation for hardness surveillance (SPEHS), hardness surveillance illuminator (HSI) and R2SPG, can be used to guide the test planner towards a successful test. By investing a few days in an experimental pretest survey, the test planner gets a set of transfer functions that allows test points to be selected and prioritized with increased confidence
  • Keywords
    electromagnetic pulse; lightning; magnetic shielding; EMP; continuous wave; coupling paths; entry points; experimental pretest survey; hardness surveillance illuminator; lightning; measurement apparatus; measurement program; random repetitive square-wave pulse generator; shielding topology; shielding topology surfaces; single point excitation for hardness surveillance; test points; transfer functions; upset threshold distribution; Circuit testing; EMP radiation effects; Electromagnetic shielding; Force measurement; Lightning; Stress; System testing; Topology; Transfer functions; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
  • Conference_Location
    Cherry Hill, NJ
  • Print_ISBN
    0-7803-0158-7
  • Type

    conf

  • DOI
    10.1109/ISEMC.1991.148201
  • Filename
    148201