The reliability of 1.3 µm emitters and detectors for fiber optics

In this paper we present lifetest data on InGaAsP/InP heterojunction LEDs, lasers and detectors. The data indicates that both edge-emitting LEDs and PIN detectors can be made with very reproducible reliability. Extrapolated operating lifetimes at room temperature in excess of 10⁷hours are estimated for 1.3 µm edge-emitting LEDs and PIN detectors. While cw lasers can be reliable, this reliability is not highly reproducible, mainly due to the large temperature dependence of the threshold current and the sensitivity to joule heating and contact degradation. Lattice parameter mismatch of up to 0.3% between the InGaAsP active region and InP confining layers does not appear to have an effect on LED reliability. AuSn soldering appears to substantially improve LED reliability over that with In soldering. Finally, it appears that liquid phase epitaxy produces more reproducibly reliable light emitting devices than does vapor phase epitaxy.