• DocumentCode
    3555524
  • Title

    Parasitic capacitances can cause demodulation RFI to differ in inverting and noninverting operational amplifier circuits

  • Author

    Ghadamabadi, Hamid ; Whalen, James J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
  • fYear
    1991
  • fDate
    12-16 Aug 1991
  • Firstpage
    151
  • Lastpage
    156
  • Abstract
    The demodulation RFI responses of an inverting operational amplifier (op amp) circuit and a noninverting op amp circuit are compared. The intended voltage gain of the inverting op amp circuit is A1=-R2/R1=-10. The intended linear voltage gain of the noninverting op amp circuit is AN1 =(R1+R2)/R1=11. For both circuits, the resistor values are R1=10 kΩ and R2=100 kΩ. Analysis shows that parasitic capacitances Cin (between the inverting and noninverting inputs of the op amp) and CR1 (shunted across R1) cause the inverting op amp circuit to have better RFI immunity than the noninverting op amp circuit. The derivation is based on the hypothesis that the demodulation RFI response is caused by a second-order nonlinearity so that a 3-dB reduction in the linear voltage gain causes the second-order demodulation RFI response characterized by the transfer function H2 to be reduced by 6 dB. For the assumed values of Cin=8 pF and CR1=0.4 pF. the measured and calculated values of the difference between H2 values for the inverting and noninverting circuits were in good agreement
  • Keywords
    capacitance; demodulation; operational amplifiers; radiofrequency interference; 10 kohm; 100 kohm; RFI immunity; demodulation RFI responses; inverting operational amplifier; linear voltage gain; noninverting operational amplifier; op amp; parasitic capacitances; second-order nonlinearity; transfer function; voltage gain; Chromium; Circuits; Demodulation; Gain; Operational amplifiers; Parasitic capacitance; Radiofrequency interference; Resistors; Transfer functions; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
  • Conference_Location
    Cherry Hill, NJ
  • Print_ISBN
    0-7803-0158-7
  • Type

    conf

  • DOI
    10.1109/ISEMC.1991.148203
  • Filename
    148203