DocumentCode
3555524
Title
Parasitic capacitances can cause demodulation RFI to differ in inverting and noninverting operational amplifier circuits
Author
Ghadamabadi, Hamid ; Whalen, James J.
Author_Institution
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
fYear
1991
fDate
12-16 Aug 1991
Firstpage
151
Lastpage
156
Abstract
The demodulation RFI responses of an inverting operational amplifier (op amp) circuit and a noninverting op amp circuit are compared. The intended voltage gain of the inverting op amp circuit is A 1=-R 2/R 1=-10. The intended linear voltage gain of the noninverting op amp circuit is A N1 =(R 1+R 2)/R 1=11. For both circuits, the resistor values are R 1=10 kΩ and R 2=100 kΩ. Analysis shows that parasitic capacitances C in (between the inverting and noninverting inputs of the op amp) and CR 1 (shunted across R 1) cause the inverting op amp circuit to have better RFI immunity than the noninverting op amp circuit. The derivation is based on the hypothesis that the demodulation RFI response is caused by a second-order nonlinearity so that a 3-dB reduction in the linear voltage gain causes the second-order demodulation RFI response characterized by the transfer function H2 to be reduced by 6 dB. For the assumed values of C in=8 pF and CR 1=0.4 pF. the measured and calculated values of the difference between H 2 values for the inverting and noninverting circuits were in good agreement
Keywords
capacitance; demodulation; operational amplifiers; radiofrequency interference; 10 kohm; 100 kohm; RFI immunity; demodulation RFI responses; inverting operational amplifier; linear voltage gain; noninverting operational amplifier; op amp; parasitic capacitances; second-order nonlinearity; transfer function; voltage gain; Chromium; Circuits; Demodulation; Gain; Operational amplifiers; Parasitic capacitance; Radiofrequency interference; Resistors; Transfer functions; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
Conference_Location
Cherry Hill, NJ
Print_ISBN
0-7803-0158-7
Type
conf
DOI
10.1109/ISEMC.1991.148203
Filename
148203
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