DocumentCode
3555561
Title
Highly reliable and mode-stabilized (GaAl)As double-heterostructure visible lasers on p-GaAs substrate
Author
Hayakawa, T. ; Yamamoto, S. ; Hayashi, H. ; Ohtsuka, N. ; Murata, K. ; Takagi, J. ; Sakurai, T. ; Hijikata, T.
Author_Institution
Sharp Corporation, Nara, Japan
Volume
27
fYear
1981
fDate
1981
Firstpage
443
Lastpage
446
Abstract
A new channeled-substrate (GaAl)As double-heterostructure (DH) visible laser on p-GaAs, called a V-channeled Substrate Inner Stripe (VSIS) laser, has been developed. A built-in optical waveguide and internal current confinement are realized in the structure. The lasers with emission wavelength of 760-790 nm reproducibly provide a single mode operation up to 20 mW/facet cw. For (GaAl)As visible lasers, Te is usually used as a dopant in the n-type cladding layer. This Te, however, is found to lower the reliability of the conventional oxide-stripe lasers where the active layer is deposited on the Te doped n-type cladding layer, even when the Te concentration is lower than 5 × 1017cm-3. On the other hand, the n-type cladding layer is grown on the active layer in the VSIS laser. Consequently, the degradation which arises from the rather poor quality of the Te doped cladding layer is suppressed in the VSIS laser although the Te concentration is as high as 1 × 1018cm-3. The VSIS lasers with
nm have been continuously operating with almost no degradation for 2000 hours at 10 mW/ facet (5 mW/µ m) operation at 50 °C up to the present.
nm have been continuously operating with almost no degradation for 2000 hours at 10 mW/ facet (5 mW/µ m) operation at 50 °C up to the present.Keywords
DH-HEMTs; Degradation; Laser modes; Optical waveguides; Semiconductor lasers; Substrates; Surface emitting lasers; Tellurium; Threshold current; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1981 International
Type
conf
DOI
10.1109/IEDM.1981.190110
Filename
1482063
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