• DocumentCode
    3555561
  • Title

    Highly reliable and mode-stabilized (GaAl)As double-heterostructure visible lasers on p-GaAs substrate

  • Author

    Hayakawa, T. ; Yamamoto, S. ; Hayashi, H. ; Ohtsuka, N. ; Murata, K. ; Takagi, J. ; Sakurai, T. ; Hijikata, T.

  • Author_Institution
    Sharp Corporation, Nara, Japan
  • Volume
    27
  • fYear
    1981
  • fDate
    1981
  • Firstpage
    443
  • Lastpage
    446
  • Abstract
    A new channeled-substrate (GaAl)As double-heterostructure (DH) visible laser on p-GaAs, called a V-channeled Substrate Inner Stripe (VSIS) laser, has been developed. A built-in optical waveguide and internal current confinement are realized in the structure. The lasers with emission wavelength of 760-790 nm reproducibly provide a single mode operation up to 20 mW/facet cw. For (GaAl)As visible lasers, Te is usually used as a dopant in the n-type cladding layer. This Te, however, is found to lower the reliability of the conventional oxide-stripe lasers where the active layer is deposited on the Te doped n-type cladding layer, even when the Te concentration is lower than 5 × 1017cm-3. On the other hand, the n-type cladding layer is grown on the active layer in the VSIS laser. Consequently, the degradation which arises from the rather poor quality of the Te doped cladding layer is suppressed in the VSIS laser although the Te concentration is as high as 1 × 1018cm-3. The VSIS lasers with \\lambda \\sim 770 nm have been continuously operating with almost no degradation for 2000 hours at 10 mW/ facet (5 mW/µ m) operation at 50 °C up to the present.
  • Keywords
    DH-HEMTs; Degradation; Laser modes; Optical waveguides; Semiconductor lasers; Substrates; Surface emitting lasers; Tellurium; Threshold current; Waveguide lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1981 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1981.190110
  • Filename
    1482063