DocumentCode :
3555588
Title :
1.25 Micron injection logic technology
Author :
Vora, M. ; Rust, W. ; Radigan, S. ; Radigan, K.
Author_Institution :
Fairchild Camera and Instrument Corporation, Palo Alto, California
Volume :
27
fYear :
1981
fDate :
1981
Firstpage :
524
Lastpage :
527
Abstract :
The injection logic technology offers a significant advantage over other bipolar and MOS technologies with respect to its ability to scale to micron and submicron dimensions to improve speed and density and at the same time scale the power. It is demonstrated in this paper that 1.25 micron injection logic gates could be made with speeds in the 1 to 2 ns range operating in the power range of 40 to 80 microwatts. Simulations based on these experimental results show that 0.5 micron injection logic gates can be made with speeds of 300 to 400 picoseconds with the same power.
Keywords :
Cameras; Capacitance; Degradation; Delay effects; Instruments; Laboratories; Logic devices; Logic gates; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1981 International
Type :
conf
DOI :
10.1109/IEDM.1981.190135
Filename :
1482088
Link To Document :
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