Title :
ST-CMOS (Stacked Transistors CMOS): A double-poly-NMOS-compatible CMOS technology
Author :
Colinge, J.P. ; Demoulin, E.
Author_Institution :
CNET-CNS, Meylan, France
Abstract :
A modified double-poly NMOS technology is proposed, providing CMOS structures. The P-channel transistors are made in the second poly layer. The process scheme is standard, except for the laser annealing step. A method of laser annealing of processed [even non-planar] samples is derived, giving rise to a concept of selective annealing. Hole mobility up to 120 cm2/V.S, was reached in the polysilicon transistors. The characteristics of the bulk N-channel transistors are kept unmodified by laser exposure.
Keywords :
Annealing; CMOS technology; Chemical lasers; Chemical technology; MOS devices; Nonhomogeneous media; Optical device fabrication; Silicon; Substrates; Very large scale integration;
Conference_Titel :
Electron Devices Meeting, 1981 International
DOI :
10.1109/IEDM.1981.190144