Title :
System ESD immunity through gate array design
Author :
Wong, S. William
Author_Institution :
Apple Computer Inc., Cupertino, CA, USA
Abstract :
A major source of today´s electronic system electrostatic discharge (ESD) failure mechanism is the EM field radiation interference from ESD. The conventional ways to harden the system immunity against this electromagnetic interference (EMI) field susceptibility include shielding, ground bonding, noise pickup circuit loop reduction, noise decoupling, and suppression. The case presented involves resolving a desktop computer system ESD susceptibility problem by using circuit design changes to custom gate array ICs to achieve the system ESD immunity
Keywords :
application specific integrated circuits; electromagnetic interference; electrostatic discharge; logic arrays; microcomputers; EM field radiation interference; EMI field susceptibility; custom IC; desktop computer system; electronic system ESD immunity; gate array design; Bonding; Circuit noise; Electromagnetic interference; Electromagnetic radiation; Electromagnetic radiative interference; Electrostatic discharge; Electrostatic interference; Failure analysis; Noise reduction; Radiation hardening;
Conference_Titel :
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0158-7
DOI :
10.1109/ISEMC.1991.148230
