• DocumentCode
    3555677
  • Title

    A graph compaction approach to fault simulation

  • Author

    Harel, Dov ; Krishnamurthy, Balakrishnan

  • Author_Institution
    Tektronix Inc., Beaverton, OR, USA
  • fYear
    1988
  • fDate
    12-15 June 1988
  • Firstpage
    601
  • Lastpage
    604
  • Abstract
    The authors describe a graph-compaction-based algorithm for fault simulation in combination circuits. The algorithm consists of reducing the circuit graph by repeatedly removing nonreconvergent vertices. The algorithm has been implemented in Smalltalk and preliminary experimental results are presented. A version of the algorithm outperforms all known fault simulation algorithms on a family of hard circuits.<>
  • Keywords
    combinatorial circuits; graph theory; logic testing; Smalltalk; combination circuits; fault simulation; graph compaction; logic testing; nonreconvergent vertices; Algorithm design and analysis; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Compaction; Computational modeling; Decoding; Fault detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0864-1
  • Type

    conf

  • DOI
    10.1109/DAC.1988.14824
  • Filename
    14824