Title :
Automatic functional test program generation for microprocessors
Author :
Lin, Chen-Shang ; Ho, Hong-Fa
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
An algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weight-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%
Keywords :
automatic programming; automatic testing; computer testing; logic testing; microprocessor chips; O-algorithm; automatic test program generation; functional test; microprocessors; signal flow; user environment; weight-digraph model; Automatic control; Automatic testing; Circuit faults; Circuit testing; Decoding; Microprocessors; Registers; Signal generators; System testing; Turing machines;
Conference_Titel :
Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-8186-0864-1
DOI :
10.1109/DAC.1988.14825
