• DocumentCode
    3555697
  • Title

    Using the single point excitation technique to measure aperture impedance over a broad frequency range

  • Author

    Hoeft, L.O. ; Hofstra, J.S. ; Prather, William D.

  • Author_Institution
    BDM Int. Inc., Albuquerque, NM, USA
  • fYear
    1991
  • fDate
    12-16 Aug 1991
  • Firstpage
    372
  • Lastpage
    373
  • Abstract
    Single point excitation for hardness surveillance (SPEHS) techniques have been used to produce surface fields over a broad frequency range (essentially 1 to 100 MHz). These fields were used to measure the aperture impedance of hardened and degraded windows and doors of the electromagnetic pulse (EMP) testbed aircraft (EMPTAC). Measurements were made using wing root (normal SPEHS) as well as antenna excitation. Above 1 MHz. aperture impedance is dominated by the aperture´s transfer inductance. Values of aperture impedance were comparable to, but did not exactly match, those measured using the aperture tester technique. The SPEHS technique has great potential because it facilitates shielding and conductive penetration measurements when the aircraft is pressurized and/or in flight
  • Keywords
    aerospace testing; electric impedance measurement; electromagnetic pulse; magnetic shielding; 1 to 100 MHz; EMP testbed aircraft; HF; MF; SPEHS; VHF; antenna excitation; aperture impedance measurement; aperture tester; conductive penetration measurements; doors; electromagnetic pulse; frequency range; hardness surveillance; in flight measurements; shielding measurement; single point excitation technique; surface fields; transfer inductance; windows; wing root; Aircraft; Antenna measurements; Apertures; EMP radiation effects; Electromagnetic measurements; Frequency; Impedance measurement; Pulse measurements; Surveillance; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
  • Conference_Location
    Cherry Hill, NJ
  • Print_ISBN
    0-7803-0158-7
  • Type

    conf

  • DOI
    10.1109/ISEMC.1991.148258
  • Filename
    148258