DocumentCode :
3555704
Title :
The malfunction mechanism of digital circuits due to ground potential fluctuations. II
Author :
Nitta, Shuichi ; Ebihara, Kazumi ; Mutoh, Atsuo ; Kakimoto, Hideaki
Author_Institution :
Tokyo Univ. of Agric. & Technol., Japan
fYear :
1991
fDate :
12-16 Aug 1991
Firstpage :
405
Lastpage :
406
Abstract :
For pt.I see ibid., vol.1, p.394 (1989). One of the causes of digital circuit malfunctions due to ground given potential fluctuation is clarified. Attention is given to the delay time occurring while ground potential fluctuation is propagating through the power supply line, its return line, signal line, and so on. It is experimentally and quantitatively clarified in the relationship among circuits malfunction, line length difference, ground potential level, and fluctuation frequency that the difference in each other´s propagation is transformed to DC power supply fluctuation and signal-level fluctuation, and can be the cause of circuit malfunction
Keywords :
digital integrated circuits; earthing; DC power supply fluctuation; delay time; digital circuit malfunctions; fluctuation frequency; ground potential fluctuations; ground potential level; line length difference; power supply line; return line; signal line; signal-level fluctuation; Agriculture; Attenuation; Digital circuits; Frequency; Impedance; Power supplies; Propagation delay; RLC circuits; Resonance; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0158-7
Type :
conf
DOI :
10.1109/ISEMC.1991.148264
Filename :
148264
Link To Document :
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