• DocumentCode
    3555704
  • Title

    The malfunction mechanism of digital circuits due to ground potential fluctuations. II

  • Author

    Nitta, Shuichi ; Ebihara, Kazumi ; Mutoh, Atsuo ; Kakimoto, Hideaki

  • Author_Institution
    Tokyo Univ. of Agric. & Technol., Japan
  • fYear
    1991
  • fDate
    12-16 Aug 1991
  • Firstpage
    405
  • Lastpage
    406
  • Abstract
    For pt.I see ibid., vol.1, p.394 (1989). One of the causes of digital circuit malfunctions due to ground given potential fluctuation is clarified. Attention is given to the delay time occurring while ground potential fluctuation is propagating through the power supply line, its return line, signal line, and so on. It is experimentally and quantitatively clarified in the relationship among circuits malfunction, line length difference, ground potential level, and fluctuation frequency that the difference in each other´s propagation is transformed to DC power supply fluctuation and signal-level fluctuation, and can be the cause of circuit malfunction
  • Keywords
    digital integrated circuits; earthing; DC power supply fluctuation; delay time; digital circuit malfunctions; fluctuation frequency; ground potential fluctuations; ground potential level; line length difference; power supply line; return line; signal line; signal-level fluctuation; Agriculture; Attenuation; Digital circuits; Frequency; Impedance; Power supplies; Propagation delay; RLC circuits; Resonance; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
  • Conference_Location
    Cherry Hill, NJ
  • Print_ISBN
    0-7803-0158-7
  • Type

    conf

  • DOI
    10.1109/ISEMC.1991.148264
  • Filename
    148264