DocumentCode :
3555708
Title :
Design radar absorbing materials (RAMs) for wide range of angles of incidence
Author :
Perini, Jose ; Cohen, Lawrence S.
Author_Institution :
ECE Dept., Syracuse Univ., NY, USA
fYear :
1991
fDate :
12-16 Aug 1991
Firstpage :
418
Lastpage :
424
Abstract :
Usually radar absorbing materials (RAMs) for electromagnetic compatibility (EMC) applications absorb radio frequency (RF) energy at a specified rate at nearly normal angles of incidence. However, there are applications where RAM is required to perform at angles greater than 30° from normal incidence where a portion of the RF energy is scattered instead of being absorbed. This scattered energy has the potential for being a source of electromagnetic interference (EMI) to a nearby receiver. It is possible to fabricate a RAM that will maintain a minimum absorption rate over a wide range of angles of incidence. This can be accomplished by covering a base lossy dielectric slab with several matching layers. The dielectric constants of these layers are then chosen in such a way that all incoming rays. within the range of interest, are bent enough to penetrate the lossy layer close to normal incidence. This is similar to the processing used in coated lenses of photographic cameras to eliminate reflections of visible light
Keywords :
dielectric materials; electromagnetic compatibility; electromagnetic interference; electromagnetic wave absorption; radar; EMC; EMI; RF energy absorption; absorption rate; angles of incidence; dielectric constants; electromagnetic compatibility; electromagnetic interference; lossy dielectric slab; nearby receiver; radar absorbing materials; scattered energy; Dielectric losses; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic scattering; Electromagnetic wave absorption; Light scattering; Potential energy; Radar applications; Radar scattering; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0158-7
Type :
conf
DOI :
10.1109/ISEMC.1991.148268
Filename :
148268
Link To Document :
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