• DocumentCode
    3555763
  • Title

    HgCdTe CCD area arrays for infrared imaging in the 3-5 µm spectral region

  • Author

    Cederberg, A.A. ; Borrello, S.R.

  • Author_Institution
    Texas Instruments Incorporated, Dallas, Texas
  • fYear
    1982
  • fDate
    13-15 Dec. 1982
  • Firstpage
    149
  • Lastpage
    152
  • Abstract
    Monolithic HgCdTe charge coupled device (CCD) area arrays are being developed for scanning imaging systems in the 3-5 µm spectral region. The CCD arrays studied have: 1) multiple parallel columns composed of CCD shift registers which perform the time-delay-and-integrate (TDI) function when operated in a scanning mode, and 2) CCD multiplexers for signal readout. The first prototype imagery from a 32 × 16 HgCdTe CCD (5 µm cutoff wavelength) array will be presented. Bar pattern imagery for a 16 × 4 CCD array will be shown. The imaging demonstrations have been made using pulsed illumination in the staring mode. Results showing nearly linear IR flux integration by all sixteen columns of a 32 × 16 CCD array will be included. An evaluation of blooming in the 16 × 4 array revealed that flux equivalent to a target temperature of 390 K caused no significant column-to-column or pixel-to-pixel blooming for single pixel illumination.
  • Keywords
    Charge coupled devices; Dark current; Degradation; Geometry; Infrared imaging; Multiplexing; Prototypes; Shift registers; Signal generators; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1982 International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/IEDM.1982.190237
  • Filename
    1482771