DocumentCode :
3555773
Title :
A GaP/AlxGal-xP heterojunction bipolar junction transistor for high-temperature electronic applications
Author :
Zipperian, T.E. ; Dawson, L.R.
Author_Institution :
Sandia National Laboratories, Albuquerque, New Mexico
Volume :
28
fYear :
1982
fDate :
1982
Firstpage :
181
Lastpage :
184
Abstract :
Useful bipolar transistor action over the full temperature range from 78 to 823K has been demonstrated for mesa-isolated, liquid-phase epitaxial n+npn, GaP/ Al0.35Ga0.65P/GaP/GaP structures. This represents both the highest temperature and the widest temperature range (745K) over which useful solid-state transistor action has ever been demonstrated in any III-V compound semiconductor system. These results imply that the GaP/AlxGa1-xP chemical system is an excellent materials candidate in which to base a technology for high-temperature electronics and the results also imply the very real possibility of functional solid-state devices and circuits at temperatures in excess of 500°C.
Keywords :
Bipolar transistors; Chemical technology; Contacts; Gold; Heterojunction bipolar transistors; Laboratories; Semiconductor materials; Solid state circuits; Space technology; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1982 International
Type :
conf
DOI :
10.1109/IEDM.1982.190246
Filename :
1482780
Link To Document :
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