• DocumentCode
    3555786
  • Title

    The SWAMI - A defect free and near-zero bird´s-beak local oxidation process and its application in VLSI technology

  • Author

    Chiu, K.Y. ; Fang, R. ; Lin, J. ; Moll, J.L. ; Lage, C. ; Angelos, S. ; Tillman, R.

  • Author_Institution
    Hewlett Packard Laboratories, Palo Alto, California
  • Volume
    28
  • fYear
    1982
  • fDate
    1982
  • Firstpage
    224
  • Lastpage
    227
  • Abstract
    A new scheme for SWAMI (Side WAll Masked Isolation) process is presented which takes full advantage of LOCOS processing without suffering the difficulties. The new SWAMI technology incorporates a sloped silicon sidewall and thin nitride around the island sidewalls such that both intrinsic nitride stress and volume expansion induced stress are greatly reduced. A defect free and near-zero bird´s beak local oxidation process can be realized by the SWAMI. Fabrication technology and MOSFET electrical characteristics will be discussed. A SWAMI/CMOS circuit including 60K ROM, 2.5K SRAM, and 100 segments of display driver with 5.13 × 5.22 mm2 chip size has been successfully fabricated. The results indicate that the SWAMI is capable of replacing the LOCOS as the isolation technology for scaled VLSI circuit fabrication.
  • Keywords
    CMOS technology; Electric variables; Fabrication; Isolation technology; MOSFET circuits; Oxidation; Read only memory; Silicon; Stress; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1982 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1982.190258
  • Filename
    1482792