DocumentCode
3555786
Title
The SWAMI - A defect free and near-zero bird´s-beak local oxidation process and its application in VLSI technology
Author
Chiu, K.Y. ; Fang, R. ; Lin, J. ; Moll, J.L. ; Lage, C. ; Angelos, S. ; Tillman, R.
Author_Institution
Hewlett Packard Laboratories, Palo Alto, California
Volume
28
fYear
1982
fDate
1982
Firstpage
224
Lastpage
227
Abstract
A new scheme for SWAMI (Side WAll Masked Isolation) process is presented which takes full advantage of LOCOS processing without suffering the difficulties. The new SWAMI technology incorporates a sloped silicon sidewall and thin nitride around the island sidewalls such that both intrinsic nitride stress and volume expansion induced stress are greatly reduced. A defect free and near-zero bird´s beak local oxidation process can be realized by the SWAMI. Fabrication technology and MOSFET electrical characteristics will be discussed. A SWAMI/CMOS circuit including 60K ROM, 2.5K SRAM, and 100 segments of display driver with 5.13 × 5.22 mm2 chip size has been successfully fabricated. The results indicate that the SWAMI is capable of replacing the LOCOS as the isolation technology for scaled VLSI circuit fabrication.
Keywords
CMOS technology; Electric variables; Fabrication; Isolation technology; MOSFET circuits; Oxidation; Read only memory; Silicon; Stress; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1982 International
Type
conf
DOI
10.1109/IEDM.1982.190258
Filename
1482792
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