DocumentCode
3555826
Title
Low threshold 1.3 µm GaInAsP/InP buried optical waveguide lasers
Author
Ng, Wilfred ; Jiang, C.L. ; Dapkus, P.D.
Author_Institution
Rockwell International, Thousand Oaks, CA
fYear
1982
fDate
13-15 Dec. 1982
Firstpage
357
Lastpage
359
Abstract
Low threshold GaInAsP/InP Buried Optical Waveguide lasers emitting at 1.3 µm were successfully fabricated by two step liquid phase epitaxy. Room temperature CW threshold current as low as 59 mA (corresponding to ∼ 11 mA per micron active stripe width) and CW differential quantum efficiencies of 26%/facet was achieved. CW operation was achieved for these devices at heat sink temperatures as high as 70°C. A single transverse mode (∼ 13 to 20° angular divergence) was obtained at more than twice the threshold current. The mechanism for transverse mode stabilization is believed to result from scattering "losses" suffered by the higher order transverse modes at the buried mesa sidewalls. No relaxation oscillation was observed in their transient response.
Keywords
Epitaxial growth; Heat sinks; Indium phosphide; Liquid waveguides; Optical scattering; Optical waveguides; Stimulated emission; Temperature; Threshold current; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1982 International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/IEDM.1982.190294
Filename
1482828
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