DocumentCode
3555892
Title
Material and device considerations for selectively doped heterojunction transistors
Author
DiLorenzo, J.V. ; Dingle, R. ; Feuer, M. ; Gossard, A.C. ; Hendel, R. ; Hwang, J.C.M. ; Kastalsky, A. ; Keramidas, V.G. ; Kiehl, R.A. ; O´Connor, Patrick
Author_Institution
Bell Laboratories, Murray Hill, New Jersey
Volume
28
fYear
1982
fDate
1982
Firstpage
578
Lastpage
581
Abstract
The material growth, discrete device fabrication, and ring oscillator fabrication for selectively doped heterostructure transistors (SDHT) is described. MBE growth of high mobility GaAs-Alx Ga1-x AS hetero junction structures has resulted in mobilities as high as
cm2/V sec at ∼4 °K. Devices with gm = 309 mS/mm at 77°K and source-drain resistance as low as 0.69 Ω mm have been fabricated. Eleven stage ring oscillators with propagation delays as low as 17.9 psec at 77°K for ∼ 1
m gate length has been achieved.
cm2/V sec at ∼4 °K. Devices with g
m gate length has been achieved.Keywords
Delay; Doping profiles; Electron mobility; Gallium arsenide; HEMTs; Heterojunctions; MODFETs; Molecular beam epitaxial growth; Ring oscillators; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1982 International
Type
conf
DOI
10.1109/IEDM.1982.190358
Filename
1482892
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