DocumentCode
3555927
Title
Twin-Tub CMOS II-An advanced VLSI technology
Author
Parrillo, L.C. ; Wang, L.K. ; Swenumson, R.D. ; Field, R.L. ; Melin, R.C. ; Levy, R.A.
Author_Institution
Bell Laboratories, Murray Hill, New Jersey
Volume
28
fYear
1982
fDate
1982
Firstpage
706
Lastpage
709
Abstract
An advanced CMOS technology has been developed for the fabrication of VLSI circuits having 2.5 µm features. The structure uses Twin-Tubs in a lightly-doped n-epitaxial layer over an n+-substrate2. Local oxidation and self-aligned chan-stops provide device isolation. The gate level has a nominal sheet resistance of 2.5Ω/□ and consists of a composite layer of TaSi2 over n+polysilicon. The gate oxide is 350 Å thick, and the electrical channel lengths for the n- and p-channel transistors are nominally 1.5 µm The threshold voltages of the n- and p-channel devices are 0.7V and -1.1V respectively. A compensating threshold-adjustment implant is used to tailor the p-channel threshold voltage. The limitations and advantages of this technique are addressed here. We present the process highlights discuss the device properties and present some of the applications of this technology.
Keywords
CMOS technology; Circuits; Electric resistance; Etching; Implants; Isolation technology; Oxidation; Protection; Threshold voltage; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1982 International
Type
conf
DOI
10.1109/IEDM.1982.190392
Filename
1482926
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