• DocumentCode
    3555927
  • Title

    Twin-Tub CMOS II-An advanced VLSI technology

  • Author

    Parrillo, L.C. ; Wang, L.K. ; Swenumson, R.D. ; Field, R.L. ; Melin, R.C. ; Levy, R.A.

  • Author_Institution
    Bell Laboratories, Murray Hill, New Jersey
  • Volume
    28
  • fYear
    1982
  • fDate
    1982
  • Firstpage
    706
  • Lastpage
    709
  • Abstract
    An advanced CMOS technology has been developed for the fabrication of VLSI circuits having 2.5 µm features. The structure uses Twin-Tubs in a lightly-doped n-epitaxial layer over an n+-substrate2. Local oxidation and self-aligned chan-stops provide device isolation. The gate level has a nominal sheet resistance of 2.5Ω/□ and consists of a composite layer of TaSi2over n+polysilicon. The gate oxide is 350 Å thick, and the electrical channel lengths for the n- and p-channel transistors are nominally 1.5 µm The threshold voltages of the n- and p-channel devices are 0.7V and -1.1V respectively. A compensating threshold-adjustment implant is used to tailor the p-channel threshold voltage. The limitations and advantages of this technique are addressed here. We present the process highlights discuss the device properties and present some of the applications of this technology.
  • Keywords
    CMOS technology; Circuits; Electric resistance; Etching; Implants; Isolation technology; Oxidation; Protection; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1982 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1982.190392
  • Filename
    1482926