DocumentCode :
3555927
Title :
Twin-Tub CMOS II-An advanced VLSI technology
Author :
Parrillo, L.C. ; Wang, L.K. ; Swenumson, R.D. ; Field, R.L. ; Melin, R.C. ; Levy, R.A.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
Volume :
28
fYear :
1982
fDate :
1982
Firstpage :
706
Lastpage :
709
Abstract :
An advanced CMOS technology has been developed for the fabrication of VLSI circuits having 2.5 µm features. The structure uses Twin-Tubs in a lightly-doped n-epitaxial layer over an n+-substrate2. Local oxidation and self-aligned chan-stops provide device isolation. The gate level has a nominal sheet resistance of 2.5Ω/□ and consists of a composite layer of TaSi2over n+polysilicon. The gate oxide is 350 Å thick, and the electrical channel lengths for the n- and p-channel transistors are nominally 1.5 µm The threshold voltages of the n- and p-channel devices are 0.7V and -1.1V respectively. A compensating threshold-adjustment implant is used to tailor the p-channel threshold voltage. The limitations and advantages of this technique are addressed here. We present the process highlights discuss the device properties and present some of the applications of this technology.
Keywords :
CMOS technology; Circuits; Electric resistance; Etching; Implants; Isolation technology; Oxidation; Protection; Threshold voltage; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1982 International
Type :
conf
DOI :
10.1109/IEDM.1982.190392
Filename :
1482926
Link To Document :
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