DocumentCode
3555997
Title
VIA GaAsFETs connected by photoelectrochemical plating
Author
D´Asaro, L.A. ; Kohl, P.A. ; Wolowodiuk, C. ; Ostermayer, F.W., Jr.
Author_Institution
Bell Laboratories, Murray Hill, New Jersey
Volume
29
fYear
1983
fDate
1983
Firstpage
123
Lastpage
126
Abstract
The advantages of via transistors made by plasma etching are higher gain, wider bandwidth, and increased packing density compared to wire bonded devices. These advantages become increasingly important at frequencies above 4 GHz. In order to obtain low thermal resistance and stable metallurgy the vias must be filled with metal. To accomplish this result, we have developed a new photoelectrochemical technique for filling the vias with a solid metal deposit such as gold. The method produces reliable devices and is suitable for manufacture.
Keywords
Bandwidth; Bonding; Etching; Frequency; Plasma applications; Plasma density; Plasma devices; Plasma stability; Thermal resistance; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1983 International
Type
conf
DOI
10.1109/IEDM.1983.190456
Filename
1483581
Link To Document