• DocumentCode
    3555997
  • Title

    VIA GaAsFETs connected by photoelectrochemical plating

  • Author

    D´Asaro, L.A. ; Kohl, P.A. ; Wolowodiuk, C. ; Ostermayer, F.W., Jr.

  • Author_Institution
    Bell Laboratories, Murray Hill, New Jersey
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    123
  • Lastpage
    126
  • Abstract
    The advantages of via transistors made by plasma etching are higher gain, wider bandwidth, and increased packing density compared to wire bonded devices. These advantages become increasingly important at frequencies above 4 GHz. In order to obtain low thermal resistance and stable metallurgy the vias must be filled with metal. To accomplish this result, we have developed a new photoelectrochemical technique for filling the vias with a solid metal deposit such as gold. The method produces reliable devices and is suitable for manufacture.
  • Keywords
    Bandwidth; Bonding; Etching; Frequency; Plasma applications; Plasma density; Plasma devices; Plasma stability; Thermal resistance; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190456
  • Filename
    1483581