DocumentCode
3556005
Title
Directions in CMOS technology
Author
Kohyama, Susumu ; Matsunaga, Jun´Ichi ; Hashimoto, Kazuhiko
Author_Institution
Toshiba Corporation, Kawasaki, Japan
Volume
29
fYear
1983
fDate
1983
Firstpage
151
Lastpage
154
Abstract
This paper describes current status and future prospect of CMOS technology for VLSI circuit applications. Though requiring various improvements and optimizations, CMOS device structures and process steps remain to be rather conventional down to 1.2 µm, and real innovation or evolution is expected to come below 1.0 µm or in the sub-micron region. In that context, the authors review bulk CMOS technology from 2µm to sub-micron features based upon existing device characteristics, and also discuss directions for further downward scaling.
Keywords
Batteries; CMOS logic circuits; CMOS process; CMOS technology; Impurities; Laboratories; Large scale integration; MOS devices; Technological innovation; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1983 International
Type
conf
DOI
10.1109/IEDM.1983.190464
Filename
1483589
Link To Document