DocumentCode :
3556005
Title :
Directions in CMOS technology
Author :
Kohyama, Susumu ; Matsunaga, Jun´Ichi ; Hashimoto, Kazuhiko
Author_Institution :
Toshiba Corporation, Kawasaki, Japan
Volume :
29
fYear :
1983
fDate :
1983
Firstpage :
151
Lastpage :
154
Abstract :
This paper describes current status and future prospect of CMOS technology for VLSI circuit applications. Though requiring various improvements and optimizations, CMOS device structures and process steps remain to be rather conventional down to 1.2 µm, and real innovation or evolution is expected to come below 1.0 µm or in the sub-micron region. In that context, the authors review bulk CMOS technology from 2µm to sub-micron features based upon existing device characteristics, and also discuss directions for further downward scaling.
Keywords :
Batteries; CMOS logic circuits; CMOS process; CMOS technology; Impurities; Laboratories; Large scale integration; MOS devices; Technological innovation; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1983 International
Type :
conf
DOI :
10.1109/IEDM.1983.190464
Filename :
1483589
Link To Document :
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