• DocumentCode
    3556005
  • Title

    Directions in CMOS technology

  • Author

    Kohyama, Susumu ; Matsunaga, Jun´Ichi ; Hashimoto, Kazuhiko

  • Author_Institution
    Toshiba Corporation, Kawasaki, Japan
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    151
  • Lastpage
    154
  • Abstract
    This paper describes current status and future prospect of CMOS technology for VLSI circuit applications. Though requiring various improvements and optimizations, CMOS device structures and process steps remain to be rather conventional down to 1.2 µm, and real innovation or evolution is expected to come below 1.0 µm or in the sub-micron region. In that context, the authors review bulk CMOS technology from 2µm to sub-micron features based upon existing device characteristics, and also discuss directions for further downward scaling.
  • Keywords
    Batteries; CMOS logic circuits; CMOS process; CMOS technology; Impurities; Laboratories; Large scale integration; MOS devices; Technological innovation; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190464
  • Filename
    1483589