Title :
Carrier tunneling related phenomena in thin oxide MOSFET´s
Author :
Chang, C. ; Liang, M.S. ; Hu, C. ; Brodersen, R.W.
Author_Institution :
University of California, Berkeley, CA
Keywords :
Charge carrier processes; EPROM; Electrons; Laboratories; Marine vehicles; Nonvolatile memory; PROM; Silicon; Tunneling; Voltage;
Conference_Titel :
Electron Devices Meeting, 1983 International
DOI :
10.1109/IEDM.1983.190474
