DocumentCode

3556014

Title

Carrier tunneling related phenomena in thin oxide MOSFET´s

Author

Chang, C. ; Liang, M.S. ; Hu, C. ; Brodersen, R.W.

Author_Institution

University of California, Berkeley, CA

Volume

29

fYear

1983

fDate

1983

Firstpage

194

Lastpage

197

Keywords

Charge carrier processes; EPROM; Electrons; Laboratories; Marine vehicles; Nonvolatile memory; PROM; Silicon; Tunneling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1983 International

Type

conf

DOI

10.1109/IEDM.1983.190474

Filename

1483599