DocumentCode :
3556025
Title :
An optimized 0.5 micron LDD transistors
Author :
Rathnam, S. ; Bahramian, H. ; Laurent, D. ; Han, Yu-Pin
Author_Institution :
Mostek Corporation, Carrollton, Texas
Volume :
29
fYear :
1983
fDate :
1983
Firstpage :
237
Lastpage :
241
Abstract :
A 0.5 micron triple diffused (LD3) NMOS transistor with a maximum operating voltage of 10 volts has been designed and fabricated. The transistor is a low doped drain type (1,3,6) with an additional boron region (halo) around the source/drain junctions. By properly tailoring this boron profile, long channel behavior can be maintained down to the sub-micron level.
Keywords :
Boron; Capacitance; Circuit synthesis; DRAM chips; Doping; Implants; MOSFETs; Resists; Threshold voltage; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1983 International
Type :
conf
DOI :
10.1109/IEDM.1983.190485
Filename :
1483610
Link To Document :
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