• DocumentCode
    3556045
  • Title

    GaAs LEDs fabricated on SiO2-coated Si wafers

  • Author

    Ohmachi, Yoshiro ; Shinoda, Yukinobu ; Nishioka, Takashi

  • Author_Institution
    Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    315
  • Lastpage
    318
  • Abstract
    GaAs LEDs are fabricated in a single-crystal GaAs/Ge composite layer on SiO2-coated Si wafers. Ge lateral epitaxy facilitated by seeded solidification from Si is successfully performed using a newly developed rf zone-heating slider system. A W capping layer, as well as a W buffer layer between Ge and SiO2, is found to promote large area, flat surface growth of Ge. GaAs epitaxial growth on Ge is realized using a MOCVD technique. The GaAs LEDs operated continuously at 3∼4V and at 40∼50mA. Device characteristics are compared with those measured for devices fabricated on GaAs wafers.
  • Keywords
    Crystallization; Epitaxial growth; Gallium arsenide; Insulation; Lattices; Light emitting diodes; Optical devices; Optical materials; Semiconductor materials; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190505
  • Filename
    1483630