DocumentCode
3556045
Title
GaAs LEDs fabricated on SiO2 -coated Si wafers
Author
Ohmachi, Yoshiro ; Shinoda, Yukinobu ; Nishioka, Takashi
Author_Institution
Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan
Volume
29
fYear
1983
fDate
1983
Firstpage
315
Lastpage
318
Abstract
GaAs LEDs are fabricated in a single-crystal GaAs/Ge composite layer on SiO2 -coated Si wafers. Ge lateral epitaxy facilitated by seeded solidification from Si is successfully performed using a newly developed rf zone-heating slider system. A W capping layer, as well as a W buffer layer between Ge and SiO2 , is found to promote large area, flat surface growth of Ge. GaAs epitaxial growth on Ge is realized using a MOCVD technique. The GaAs LEDs operated continuously at 3∼4V and at 40∼50mA. Device characteristics are compared with those measured for devices fabricated on GaAs wafers.
Keywords
Crystallization; Epitaxial growth; Gallium arsenide; Insulation; Lattices; Light emitting diodes; Optical devices; Optical materials; Semiconductor materials; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1983 International
Type
conf
DOI
10.1109/IEDM.1983.190505
Filename
1483630
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