DocumentCode :
3556113
Title :
A new cell for high capacity mask ROM by the double LOCOS technique
Author :
Sato, Noriaki ; Nawata, Takahiro ; Wada, Kunihiko
Author_Institution :
Fujitsu Limited, Kawasaki, Japan
Volume :
29
fYear :
1983
fDate :
1983
Firstpage :
581
Lastpage :
584
Abstract :
A new cell for use in an extremely high-capacity mask ROM has been developed by using the Double LOCOS (DL) technique. This cell, called a SADL cell (Self-Aligned cell by DL technique), realizes 4F^{2} area (F: minimum feature size) using a fully self-aligned fabrication process. The area of the new cells can be reduced to 1/2 of that of ordinary ROM cells, even when fabricated with conventional silicon IC technology. A 4K-bit SADL cell array was fabricated using 2-µm (diffusion line width) and 3-µm (field line width) rules, realizing a cell size of 25 µm2, the smallest reported so far. In the SADL cell, conductance is large because it is determined by the forward-biased diode characteristic. A high-speed readout method may be adopted for further speed improvement.
Keywords :
Diodes; Etching; Fabrication; High level languages; Ion implantation; Leakage current; Microcomputers; Oxidation; Read only memory; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1983 International
Type :
conf
DOI :
10.1109/IEDM.1983.190573
Filename :
1483698
Link To Document :
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