DocumentCode
3556113
Title
A new cell for high capacity mask ROM by the double LOCOS technique
Author
Sato, Noriaki ; Nawata, Takahiro ; Wada, Kunihiko
Author_Institution
Fujitsu Limited, Kawasaki, Japan
Volume
29
fYear
1983
fDate
1983
Firstpage
581
Lastpage
584
Abstract
A new cell for use in an extremely high-capacity mask ROM has been developed by using the Double LOCOS (DL) technique. This cell, called a SADL cell (Self-Aligned cell by DL technique), realizes
area (F: minimum feature size) using a fully self-aligned fabrication process. The area of the new cells can be reduced to 1/2 of that of ordinary ROM cells, even when fabricated with conventional silicon IC technology. A 4K-bit SADL cell array was fabricated using 2-µm (diffusion line width) and 3-µm (field line width) rules, realizing a cell size of 25 µm2 , the smallest reported so far. In the SADL cell, conductance is large because it is determined by the forward-biased diode characteristic. A high-speed readout method may be adopted for further speed improvement.
area (F: minimum feature size) using a fully self-aligned fabrication process. The area of the new cells can be reduced to 1/2 of that of ordinary ROM cells, even when fabricated with conventional silicon IC technology. A 4K-bit SADL cell array was fabricated using 2-µm (diffusion line width) and 3-µm (field line width) rules, realizing a cell size of 25 µmKeywords
Diodes; Etching; Fabrication; High level languages; Ion implantation; Leakage current; Microcomputers; Oxidation; Read only memory; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1983 International
Type
conf
DOI
10.1109/IEDM.1983.190573
Filename
1483698
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