• DocumentCode
    3556113
  • Title

    A new cell for high capacity mask ROM by the double LOCOS technique

  • Author

    Sato, Noriaki ; Nawata, Takahiro ; Wada, Kunihiko

  • Author_Institution
    Fujitsu Limited, Kawasaki, Japan
  • Volume
    29
  • fYear
    1983
  • fDate
    1983
  • Firstpage
    581
  • Lastpage
    584
  • Abstract
    A new cell for use in an extremely high-capacity mask ROM has been developed by using the Double LOCOS (DL) technique. This cell, called a SADL cell (Self-Aligned cell by DL technique), realizes 4F^{2} area (F: minimum feature size) using a fully self-aligned fabrication process. The area of the new cells can be reduced to 1/2 of that of ordinary ROM cells, even when fabricated with conventional silicon IC technology. A 4K-bit SADL cell array was fabricated using 2-µm (diffusion line width) and 3-µm (field line width) rules, realizing a cell size of 25 µm2, the smallest reported so far. In the SADL cell, conductance is large because it is determined by the forward-biased diode characteristic. A high-speed readout method may be adopted for further speed improvement.
  • Keywords
    Diodes; Etching; Fabrication; High level languages; Ion implantation; Leakage current; Microcomputers; Oxidation; Read only memory; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1983 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1983.190573
  • Filename
    1483698