DocumentCode
3556118
Title
Picosecond and subpicosecond optoelectronics for measurements of future high speed electronic devices
Author
Valdmanis, J.A. ; Mourou, G.A. ; Gabel, C.W.
Author_Institution
University of Rochester, Rochester, New York
Volume
29
fYear
1983
fDate
1983
Firstpage
597
Lastpage
600
Abstract
The electrooptic effect has been used in conjunction with 100 fs optical pulses to sample electrical transients with an unprecedented resolution of .5 ps and sensitivity of 50-100 µV. The electrooptic material can be used in a traveling wave geometry or in an electrodeless manner. Applications of this technique to the characterization of electrical devices and to the study of short pulse propagation are described.
Keywords
Frequency; High-speed electronics; Lithium compounds; Optical pulse generation; Optical pulses; Optical sensors; Signal processing; Ultrafast optics; Velocity measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1983 International
Type
conf
DOI
10.1109/IEDM.1983.190577
Filename
1483702
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