DocumentCode :
3556121
Title :
X and Ku-band high power GaAs FETs
Author :
Aono, Y. ; Aihara, S. ; Kaneko, Y.
Author_Institution :
NEC Corporation, Kawasaki, Japan
Volume :
29
fYear :
1983
fDate :
1983
Firstpage :
609
Lastpage :
612
Abstract :
A couple of high power GaAs MESFET chips with an improved packing density(total gatewidth per unit chip width) in their electrode pattern has been developed in order to improve RF performance at X-through Ku-band. The chip width has been reduced to approximately 40% of the previously existing power GaAs FET with the same total gatewidth. Internally matched packaged devices have exhibited 10W power output with 3dB associated gain and 17% power added efficiency at 11.2GHz, and 7W saturated power output with 5.2dB linear gain at 14.5GHz in a single package.
Keywords :
Electrodes; Fingers; Gallium arsenide; MESFETs; Microwave FETs; Microwave devices; Packaging; Pattern matching; Power generation; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1983 International
Type :
conf
DOI :
10.1109/IEDM.1983.190580
Filename :
1483705
Link To Document :
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