Title :
Fault simulation in a distributed environment
Author :
Duba, Patrick A. ; Roy, Rabindra K. ; Abraham, Jacob A. ; Rogers, William A.
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
Fault simulation of VLSI circuits takes considerable computing resources and there have been significant efforts to speed up the fault simulation process. A distributed fault simulator implemented on a loosely-coupled network of general-purpose computers is described. The techniques used result in a close to linear speedup and can be used effectively in most industrial VLSI CAD (computer-aided design) environments.<>
Keywords :
VLSI; circuit CAD; circuit analysis computing; logic CAD; CAD; VLSI circuits; computer-aided design; distributed environment; fault simulation; logic design; loosely-coupled network; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Costs; Hardware; Sequential circuits; Test pattern generators; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-8186-0864-1
DOI :
10.1109/DAC.1988.14843
