DocumentCode
3556237
Title
Buried isolation capacitor (BIC) cell for megabit MOS dynamic RAM
Author
Nakamura, Kunio ; Yanagisawa, Masayuki ; Nio, Yoshihiko ; Okamura, Kenji ; Kikuchi, Masanori
Author_Institution
NEC Corporation, Kanagawa, Japan
Volume
30
fYear
1984
fDate
1984
Firstpage
236
Lastpage
239
Abstract
A new one-transistor, one-capacitor MOS dynamic RAM cell structure called a Buried Isolation Capacitor (BIC) cell has been developed for future 4M bit and beyond VLSI memory devices. Basic concept of the new cell structure is mergence of capacitor and isolation region into a buried capacitor formed in a trench. Sidewall of the trench and the poly Si buried within the trench form two plates of the capacitor. TheIIB+-implanted p-type layer at the bottom of the trench acts as an isolation region between adjacent cells. The devised new structure, combined with submicron lithography, realizes extremely small cell size about 7 µm2. This enables reasonable size 4M bit DRAM chip about 60 mm2. Process technologies and experimental results on the electrical characteristics of the new cell structure are described.
Keywords
Conductivity; DRAM chips; Etching; Fabrication; Insulation; Large scale integration; MOS capacitors; National electric code; Random access memory; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1984 International
Type
conf
DOI
10.1109/IEDM.1984.190690
Filename
1484461
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