• DocumentCode
    3556237
  • Title

    Buried isolation capacitor (BIC) cell for megabit MOS dynamic RAM

  • Author

    Nakamura, Kunio ; Yanagisawa, Masayuki ; Nio, Yoshihiko ; Okamura, Kenji ; Kikuchi, Masanori

  • Author_Institution
    NEC Corporation, Kanagawa, Japan
  • Volume
    30
  • fYear
    1984
  • fDate
    1984
  • Firstpage
    236
  • Lastpage
    239
  • Abstract
    A new one-transistor, one-capacitor MOS dynamic RAM cell structure called a Buried Isolation Capacitor (BIC) cell has been developed for future 4M bit and beyond VLSI memory devices. Basic concept of the new cell structure is mergence of capacitor and isolation region into a buried capacitor formed in a trench. Sidewall of the trench and the poly Si buried within the trench form two plates of the capacitor. TheIIB+-implanted p-type layer at the bottom of the trench acts as an isolation region between adjacent cells. The devised new structure, combined with submicron lithography, realizes extremely small cell size about 7 µm2. This enables reasonable size 4M bit DRAM chip about 60 mm2. Process technologies and experimental results on the electrical characteristics of the new cell structure are described.
  • Keywords
    Conductivity; DRAM chips; Etching; Fabrication; Insulation; Large scale integration; MOS capacitors; National electric code; Random access memory; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1984 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1984.190690
  • Filename
    1484461