Title :
850V NMOS driver with active outputs
Author :
Martin, Russel A. ; Buhler, Steven A. ; Lao, Guillermo
Author_Institution :
Xerox PARC, Palo Alto, CA
Abstract :
This paper describes a unique second generation fully integrated NMOS device operating at up to 850V. The 5.46×5.26 mm2chip consists of 16 pull-up/pull-down high voltage output drivers, a 16 bit shift register, and gating logic. The HV output drivers are comprised of two high voltage transistors and a polysilicon pull-up resistor, fabricated on a 70Ω-cm substrate, without dielectric isolation or epitaxial material. The high voltage transistors have closed geometry with a two layer polysilicon field plate. One layer of the field plate has high sheet resistance to set the surface potential above the n- drift region. The low voltage logic is standard TTL compatible NMOS, isolated from the high voltage by a grounded barrier. An analysis of the high voltage transistors, based on a solution of Poisson´s Equation1is presented which emphasizes the effect of the overlaying metal line on the transisor´s performance.
Keywords :
Dielectric materials; Dielectric substrates; Driver circuits; Logic devices; MOS devices; Resistors; Sheet materials; Shift registers; Surface resistance; Voltage;
Conference_Titel :
Electron Devices Meeting, 1984 International
DOI :
10.1109/IEDM.1984.190698